Achintya Halder, Abhijit Chatterjee. Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits. In 10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan. pages 344, IEEE Computer Society, 2001. [doi]
@inproceedings{HalderC01,
title = {Specification Based Digital Compatible Built-in Test of Embedded Analog Circuits},
author = {Achintya Halder and Abhijit Chatterjee},
year = {2001},
url = {http://csdl.computer.org/comp/proceedings/ats/2001/1378/00/13780344abs.htm},
tags = {rule-based, testing},
researchr = {https://researchr.org/publication/HalderC01},
cites = {0},
citedby = {0},
pages = {344},
booktitle = {10th Asian Test Symposium (ATS 2001), 19-21 November 2001, Kyoto, Japan},
publisher = {IEEE Computer Society},
isbn = {0-7695-1378-6},
}