Ghaith Bany Hamad, Syed Rafay Hasan, Otmane Aït Mohamed, Yvon Savaria. Abstracting Single Event Transient characteristics variations due to input patterns and fan-out. In IEEE International Symposium on Circuits and Systemss, ISCAS 2014, Melbourne, Victoria, Australia, June 1-5, 2014. pages 1468-1471, IEEE, 2014. [doi]
Abstract is missing.