Ghaith Bany Hamad, Ghaith Kazma, Otmane Aït Mohamed, Yvon Savaria. Comprehensive non-functional analysis of combinational circuits vulnerability to single event transients. In Rolf Drechsler, Robert Wille, editors, 2016 Forum on Specification and Design Languages, FDL 2016, Bremen, Germany, September 14-16, 2016. pages 1-7, IEEE, 2016. [doi]
Abstract is missing.