Ghaith Bany Hamad, Ghaith Kazma, Otmane Aït Mohamed, Yvon Savaria. Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 33-38, IEEE, 2017. [doi]
@inproceedings{HamadKMS17, title = {Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT}, author = {Ghaith Bany Hamad and Ghaith Kazma and Otmane Aït Mohamed and Yvon Savaria}, year = {2017}, doi = {10.1109/IOLTS.2017.8046195}, url = {https://doi.org/10.1109/IOLTS.2017.8046195}, researchr = {https://researchr.org/publication/HamadKMS17}, cites = {0}, citedby = {0}, pages = {33-38}, booktitle = {23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017}, publisher = {IEEE}, isbn = {978-1-5386-0352-9}, }