Ghaith Bany Hamad, Ghaith Kazma, Otmane Aït Mohamed, Yvon Savaria. Comprehensive analysis of sequential circuits vulnerability to transient faults using SMT. In 23rd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2017, Thessaloniki, Greece, July 3-5, 2017. pages 33-38, IEEE, 2017. [doi]
No references recorded for this publication.
No citations of this publication recorded.