Ghaith Bany Hamad, Otmane Aït Mohamed, Yvon Savaria. Towards formal abstraction, modeling, and analysis of Single Event Transients at RTL. In IEEE International Symposium on Circuits and Systems, ISCAS 2016, Montréal, QC, Canada, May 22-25, 2016. pages 2166-2169, IEEE, 2016. [doi]
Abstract is missing.