Roni Hämäläinen, Henri Lunnikivi, Timo Hämäläinen 0001. Memory Mapped I/O Register Test Case Generator for Large Systems-on-Chip. In IEEE Nordic Circuits and Systems Conference, NorCAS 2023, Aalborg, Denmark, October 31 - Nov. 1, 2023. pages 1-7, IEEE, 2023. [doi]
Abstract is missing.