Linked faults in random access memories: concept, fault models, test algorithms, and industrial results - researchr publication

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Said Hamdioui, Zaid Al-Ars, A. J. van de Goor, Mike Rodgers. Linked faults in random access memories: concept, fault models, test algorithms, and industrial results. IEEE Trans. on CAD of Integrated Circuits and Systems, 23(5):737-757, 2004. [doi]

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