Said Hamdioui, Zaid Al-Ars, Ad J. Van de Goor, Rob Wadsworth. Impact of stresses on the fault coverage of memory tests. In 13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan. pages 103-108, IEEE Computer Society, 2005. [doi]
Abstract is missing.