Memory Fault Modeling Trends: A Case Study

Said Hamdioui, Rob Wadsworth, John Delos Reyes, A. J. van de Goor. Memory Fault Modeling Trends: A Case Study. J. Electronic Testing, 20(3):245-255, 2004. [doi]

Authors

Said Hamdioui

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Rob Wadsworth

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John Delos Reyes

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A. J. van de Goor

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