Said Hamdioui, Rob Wadsworth, John Delos Reyes, A. J. van de Goor. Memory Fault Modeling Trends: A Case Study. J. Electronic Testing, 20(3):245-255, 2004. [doi]
@article{HamdiouiWRG04,
title = {Memory Fault Modeling Trends: A Case Study},
author = {Said Hamdioui and Rob Wadsworth and John Delos Reyes and A. J. van de Goor},
year = {2004},
doi = {10.1023/B:JETT.0000029458.57095.bb},
url = {http://dx.doi.org/10.1023/B:JETT.0000029458.57095.bb},
tags = {case study, modeling},
researchr = {https://researchr.org/publication/HamdiouiWRG04},
cites = {0},
citedby = {0},
journal = {J. Electronic Testing},
volume = {20},
number = {3},
pages = {245-255},
}