New Techniques for Deterministic Test Pattern Generation

Ilker Hamzaoglu, Janak H. Patel. New Techniques for Deterministic Test Pattern Generation. In 16th IEEE VLSI Test Symposium (VTS 98), 28 April - 1 May 1998, Princeton, NJ, USA. pages 446-452, IEEE Computer Society, 1998. [doi]

Abstract

Abstract is missing.