Hui Han, Chenqiang Gao, Yue Zhao, Shisha Liao, Lin Tang, Xindou Li. Polycrystalline silicon wafer defect segmentation based on deep convolutional neural networks. Pattern Recognition Letters, 130:234-241, 2020. [doi]
@article{HanGZLTL20,
title = {Polycrystalline silicon wafer defect segmentation based on deep convolutional neural networks},
author = {Hui Han and Chenqiang Gao and Yue Zhao and Shisha Liao and Lin Tang and Xindou Li},
year = {2020},
doi = {10.1016/j.patrec.2018.12.013},
url = {https://doi.org/10.1016/j.patrec.2018.12.013},
researchr = {https://researchr.org/publication/HanGZLTL20},
cites = {0},
citedby = {0},
journal = {Pattern Recognition Letters},
volume = {130},
pages = {234-241},
}