Polycrystalline silicon wafer defect segmentation based on deep convolutional neural networks - researchr publication references

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Hui Han, Chenqiang Gao, Yue Zhao, Shisha Liao, Lin Tang, Xindou Li. Polycrystalline silicon wafer defect segmentation based on deep convolutional neural networks. Pattern Recognition Letters, 130:234-241, 2020. [doi]

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