Theoretic analysis and enhanced X-tolerance of test response compact based on convolutional code

Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li. Theoretic analysis and enhanced X-tolerance of test response compact based on convolutional code. In Ting-Ao Tang, editor, Proceedings of the 2005 Conference on Asia South Pacific Design Automation, ASP-DAC 2005, Shanghai, China, January 18-21, 2005. pages 53-58, ACM Press, 2005. [doi]

Abstract

Abstract is missing.