Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes - researchr publication authors

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Yinhe Han, Yu Hu, Huawei Li, Xiaowei Li, Anshuman Chandra. Response Compaction for Test Time and Test Pins Reduction Based on Advanced Convolutional Codes. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 298-305, IEEE Computer Society, 2004. [doi]

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