Jie Han, Pieter Jonker. A Study on Fault-Tolerant Circuits Using Redundancy. In Hamid R. Arabnia, Laurence Tianruo Yang, editors, Proceedings of the International Conference on VLSI, VLSI 03, June 23 - 26, 2003, Las Vegas, Nevada, USA. pages 65-69, CSREA Press, 2003.
Abstract is missing.