Hung-Chi Han, Farzan Jazaeri, Antonio A. D'Amico, Zhixing Zhao, Steffen Lehmann, Claudia Kretzschmar, Edoardo Charbon, Christian C. Enz. Cryogenic RF Characterization and Simple Modeling of a 22 nm FDSOI Technology. In 52nd IEEE European Solid-State Device Research Conference, ESSDERC 2022, Milan, Italy, September 19-22, 2022. pages 269-272, IEEE, 2022. [doi]
Abstract is missing.