Simultaneous Reduction of Test Data Volume and Testing Power for Scan-Based Test - researchr publication

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Yinhe Han, Xiaowei Li. Simultaneous Reduction of Test Data Volume and Testing Power for Scan-Based Test. In Hamid R. Arabnia, Minyi Guo, Laurence Tianruo Yang, editors, Proceedings of the International Conference on Embedded Systems and Applications, ESA 04 & Proceedings of the International Conference on VLSI, VLSI 04, June 21-24, 2004, Las Vegas, Nevada, USA. pages 374-381, CSREA Press, 2004.

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