S.-H. Han, J. H. Lee, K. S. Suh, K. T. Nam, D. E. Jeong, S. C. Oh, S.-H. Hwang, Y. Ji, K. Lee, K. Lee, Y. J. Song, Y. G. Hong, G. T. Jeong. Reliability of STT-MRAM for various embedded applications. In IEEE International Reliability Physics Symposium, IRPS 2021, Monterey, CA, USA, March 21-25, 2021. pages 1-5, IEEE, 2021. [doi]
Abstract is missing.