AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing

Qing Han, Yu Xia, Xiupeng Shi, Zeng Zeng. AutoML with Focal Loss for Defect Diagnosis and Prognosis in Smart Manufacturing. In IEEE International Conference on Cybernetics and Intelligent Systems, CIS 2023 and IEEE Conference on Robotics, Automation and Mechatronics, RAM 2023, Penang, Malaysia, June 9-12, 2023. pages 180-185, IEEE, 2023. [doi]

Abstract

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