Accurate Substrate Analysis Based on a Novel Finite Difference Method via Synchronization Method on Layered and Adaptive Meshing

Youngae Han, Jinsong Zhao. Accurate Substrate Analysis Based on a Novel Finite Difference Method via Synchronization Method on Layered and Adaptive Meshing. IEEE Trans. on CAD of Integrated Circuits and Systems, 32(10):1520-1532, 2013. [doi]

Abstract

Abstract is missing.