An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits

Mousum Handique, Jatindra Kumar Deka, Santosh Biswas. An Efficient Test Set Construction Scheme for Multiple Missing-Gate Faults in Reversible Circuits. J. Electronic Testing, 36(1):105-122, 2020. [doi]

Abstract

Abstract is missing.