Soft Error Sensibility Window at FinFET DICE SRAM

Maria Eduarda de Melo Hang, Cleiton M. Marques, Paulo F. Butzen, Cristina Meinhardt. Soft Error Sensibility Window at FinFET DICE SRAM. In 12th IEEE Latin America Symposium on Circuits and System, LASCAS 2021, Arequipa, Peru, February 21-24, 2021. pages 1-4, IEEE, 2021. [doi]

Abstract

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