A similarity-aware approach to testing based fault localization - researchr publication authors

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Dan Hao, Ying Pan, Lu Zhang, Wei Zhao, Hong Mei, Jiasu Sun. A similarity-aware approach to testing based fault localization. In David F. Redmiles, Thomas Ellman, Andrea Zisman, editors, 20th IEEE/ACM International Conference on Automated Software Engineering (ASE 2005), November 7-11, 2005, Long Beach, CA, USA. pages 291-294, ACM, 2005. [doi]

This author has not been identified. Look up 'Dan Hao' in GoogleThis author has not been identified. Look up 'Ying Pan' in GoogleThis author has not been identified. Look up 'Lu Zhang' in GoogleThis author has not been identified. Look up 'Wei Zhao' in GoogleThis author has not been identified. Look up 'Hong Mei' in GoogleThis author has not been identified. Look up 'Jiasu Sun' in Google

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