Dan Hao, Ying Pan, Lu Zhang, Wei Zhao, Hong Mei, Jiasu Sun. A similarity-aware approach to testing based fault localization. In David F. Redmiles, Thomas Ellman, Andrea Zisman, editors, 20th IEEE/ACM International Conference on Automated Software Engineering (ASE 2005), November 7-11, 2005, Long Beach, CA, USA. pages 291-294, ACM, 2005. [doi]
@inproceedings{HaoPZZMS05, title = {A similarity-aware approach to testing based fault localization}, author = {Dan Hao and Ying Pan and Lu Zhang and Wei Zhao and Hong Mei and Jiasu Sun}, year = {2005}, doi = {10.1145/1101908.1101953}, url = {http://doi.acm.org/10.1145/1101908.1101953}, tags = {rule-based, testing, context-aware, systematic-approach}, researchr = {https://researchr.org/publication/HaoPZZMS05}, cites = {0}, citedby = {0}, pages = {291-294}, booktitle = {20th IEEE/ACM International Conference on Automated Software Engineering (ASE 2005), November 7-11, 2005, Long Beach, CA, USA}, editor = {David F. Redmiles and Thomas Ellman and Andrea Zisman}, publisher = {ACM}, }