A similarity-aware approach to testing based fault localization

Dan Hao, Ying Pan, Lu Zhang, Wei Zhao, Hong Mei, Jiasu Sun. A similarity-aware approach to testing based fault localization. In David F. Redmiles, Thomas Ellman, Andrea Zisman, editors, 20th IEEE/ACM International Conference on Automated Software Engineering (ASE 2005), November 7-11, 2005, Long Beach, CA, USA. pages 291-294, ACM, 2005. [doi]

Abstract

Abstract is missing.