Zhigang Hao, Sheldon X.-D. Tan, Guoyong Shi. An efficient statistical chip-level total power estimation method considering process variations with spatial correlation. In Proceedings of the 12th International Symposium on Quality Electronic Design, ISQED 2011, Santa Clara, California, USA, 14-16 March 2011. pages 671-676, IEEE, 2011. [doi]
Abstract is missing.