Statistical full-chip total power estimation considering spatially correlated process variations

Zhigang Hao, Sheldon X.-D. Tan, Guoyong Shi. Statistical full-chip total power estimation considering spatially correlated process variations. Integration, 46(1):80-88, 2013. [doi]

Authors

Zhigang Hao

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Sheldon X.-D. Tan

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Guoyong Shi

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