Zhigang Hao, Sheldon X.-D. Tan, Guoyong Shi. Statistical full-chip total power estimation considering spatially correlated process variations. Integration, 46(1):80-88, 2013. [doi]
@article{HaoTS13,
title = {Statistical full-chip total power estimation considering spatially correlated process variations},
author = {Zhigang Hao and Sheldon X.-D. Tan and Guoyong Shi},
year = {2013},
doi = {10.1016/j.vlsi.2011.12.004},
url = {http://dx.doi.org/10.1016/j.vlsi.2011.12.004},
researchr = {https://researchr.org/publication/HaoTS13},
cites = {0},
citedby = {0},
journal = {Integration},
volume = {46},
number = {1},
pages = {80-88},
}