Friedrich Hapke, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, Michael Reese, Marek Hustava, Martin Keim, Juergen Schloeffel, Anja Fast. Cell-Aware Test. IEEE Trans. on CAD of Integrated Circuits and Systems, 33(9):1396-1409, 2014. [doi]
Abstract is missing.