Cell-aware analysis for small-delay effects and production test results from different fault models

Friedrich Hapke, Jürgen Schlöffel, Wilfried Redemund, Andreas Glowatz, Janusz Rajski, M. Reese, J. Rearick, Jason Rivers. Cell-aware analysis for small-delay effects and production test results from different fault models. In Bill Eklow, R. D. (Shawn) Blanton, editors, 2011 IEEE International Test Conference, ITC 2011, Anaheim, CA, USA, September 20-22, 2011. pages 1-8, IEEE, 2011. [doi]

Abstract

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