Masaru Haraguchi, Tokuya Osawa, Akira Yamazaki, Chikayoshi Morishima, Toshinori Morihara, Yoshikazu Morooka, Yoshihiro Okuno, Kazutami Arimoto. A Continuous-Adaptive DDR2 Interface with Flexible Round-Trip-Time and Full Self Loop-Backed AC Test. In 2007 IEEE International Solid-State Circuits Conference, ISSCC 2007, Digest of Technical Papers, San Francisco, CA, USA, February 11-15, 2007. pages 490-491, IEEE, 2007. [doi]
Abstract is missing.