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Comments on "Sources of failures and yield improvement for VLSI and restructurable interconnects for RVLSI and WSI: Part I - Sources of failures and yield improvement for VLSI"

Jim C. Harden. Comments on "Sources of failures and yield improvement for VLSI and restructurable interconnects for RVLSI and WSI: Part I - Sources of failures and yield improvement for VLSI". Proceedings of the IEEE, 74(3):515-516, 1986. [doi]

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