Modeling Open Defects in Nanometric Scale CMOS - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Anant Narayan Hariharan, Salvatore Pontarelli, Marco Ottavi, Fabrizio Lombardi. Modeling Open Defects in Nanometric Scale CMOS. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 249-257, IEEE Computer Society, 2010. [doi]

This author has not been identified. Look up 'Anant Narayan Hariharan' in GoogleThis author has not been identified. Look up 'Salvatore Pontarelli' in GoogleThis author has not been identified. Look up 'Marco Ottavi' in GoogleThis author has not been identified. Look up 'Fabrizio Lombardi' in Google

runs on WebDSL