Anant Narayan Hariharan, Salvatore Pontarelli, Marco Ottavi, Fabrizio Lombardi. Modeling Open Defects in Nanometric Scale CMOS. In 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010. pages 249-257, IEEE Computer Society, 2010. [doi]
@inproceedings{HariharanPOL10,
title = {Modeling Open Defects in Nanometric Scale CMOS},
author = {Anant Narayan Hariharan and Salvatore Pontarelli and Marco Ottavi and Fabrizio Lombardi},
year = {2010},
doi = {10.1109/DFT.2010.37},
url = {http://doi.ieeecomputersociety.org/10.1109/DFT.2010.37},
researchr = {https://researchr.org/publication/HariharanPOL10},
cites = {0},
citedby = {0},
pages = {249-257},
booktitle = {25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, DFT 2010, Kyoto, Japan, October 6-8, 2010},
publisher = {IEEE Computer Society},
isbn = {978-1-4244-8447-8},
}