Non-destructive incipient damage detection using Kullback-Leibler divergence

Jinane Harmouche, Claude Delpha, Yann Le Bihan, Demba Diallo. Non-destructive incipient damage detection using Kullback-Leibler divergence. In 24th IEEE International Symposium on Industrial Electronics, ISIE 2015, Rio de Janeiro, Brazil, June 3-5, 2015. pages 849-854, IEEE, 2015. [doi]

Authors

Jinane Harmouche

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Claude Delpha

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Yann Le Bihan

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Demba Diallo

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