Jinane Harmouche, Claude Delpha, Yann Le Bihan, Demba Diallo. Non-destructive incipient damage detection using Kullback-Leibler divergence. In 24th IEEE International Symposium on Industrial Electronics, ISIE 2015, Rio de Janeiro, Brazil, June 3-5, 2015. pages 849-854, IEEE, 2015. [doi]
@inproceedings{HarmoucheDBD15,
title = {Non-destructive incipient damage detection using Kullback-Leibler divergence},
author = {Jinane Harmouche and Claude Delpha and Yann Le Bihan and Demba Diallo},
year = {2015},
doi = {10.1109/ISIE.2015.7281581},
url = {https://doi.org/10.1109/ISIE.2015.7281581},
researchr = {https://researchr.org/publication/HarmoucheDBD15},
cites = {0},
citedby = {0},
pages = {849-854},
booktitle = {24th IEEE International Symposium on Industrial Electronics, ISIE 2015, Rio de Janeiro, Brazil, June 3-5, 2015},
publisher = {IEEE},
}