Jinane Harmouche, Claude Delpha, Yann Le Bihan, Demba Diallo. Non-destructive incipient damage detection using Kullback-Leibler divergence. In 24th IEEE International Symposium on Industrial Electronics, ISIE 2015, Rio de Janeiro, Brazil, June 3-5, 2015. pages 849-854, IEEE, 2015. [doi]
Abstract is missing.