Nor Zaidi Haron, Said Hamdioui, Nor Zaidi Haron. On Defect Oriented Testing for Hybrid CMOS/Memristor Memory. In Proceedings of the 20th IEEE Asian Test Symposium, ATS 2011, New Delhi, India, November 20-23, 2011. pages 353-358, IEEE Computer Society, 2011. [doi]
Abstract is missing.