P. A. 't Hart, Masoud Babaie, Edoardo Charbon, Andrei Vladimirescu, Fabio Sebastiano. Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 98-101, IEEE, 2019. [doi]
@inproceedings{HartBCVS19,
title = {Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures},
author = {P. A. 't Hart and Masoud Babaie and Edoardo Charbon and Andrei Vladimirescu and Fabio Sebastiano},
year = {2019},
doi = {10.1109/ESSDERC.2019.8901745},
url = {https://doi.org/10.1109/ESSDERC.2019.8901745},
researchr = {https://researchr.org/publication/HartBCVS19},
cites = {0},
citedby = {0},
pages = {98-101},
booktitle = {49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019},
publisher = {IEEE},
isbn = {978-1-7281-1539-9},
}