Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures - researchr publication related

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P. A. 't Hart, Masoud Babaie, Edoardo Charbon, Andrei Vladimirescu, Fabio Sebastiano. Subthreshold Mismatch in Nanometer CMOS at Cryogenic Temperatures. In 49th European Solid-State Device Research Conference, ESSDERC 2019, Cracow, Poland, September 23-26, 2019. pages 98-101, IEEE, 2019. [doi]

The following publications are possibly variants of this publication:

Characterization and Model Validation of Mismatch in Nanometer CMOS at Cryogenic TemperaturesP. A. 't Hart, Jeroen P. G. van Dijk, Masoud Babaie, Edoardo Charbon, A. Vladimircscu, Fabio Sebastiano. essderc 2018: 246-249 [doi]

Nanometer CMOS characterization and compact modeling at deep-cryogenic temperaturesRosario M. Incandela, L. Song, Harald A. R. Homulle, Fabio Sebastiano, Edoardo Charbon, Andrei Vladimirescu. essderc 2017: 58-61 [doi]

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