Gurgen Harutunyan, Valery A. Vardanian, Yervant Zorian. Minimal March Tests for Unlinked Static Faults in Random Access Memories. In 23rd IEEE VLSI Test Symposium (VTS 2005), 1-5 May 2005, Palm Springs, CA, USA. pages 53-59, IEEE Computer Society, 2005. [doi]
Abstract is missing.