A Test-Vector Generation Methodology for Crosstalk Noise Faults

Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park. A Test-Vector Generation Methodology for Crosstalk Noise Faults. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 40-50, IEEE Computer Society, 2002. [doi]

Authors

Hamidreza Hashempour

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Yong-Bin Kim

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Nohpill Park

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