Hamidreza Hashempour, Yong-Bin Kim, Nohpill Park. A Test-Vector Generation Methodology for Crosstalk Noise Faults. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 40-50, IEEE Computer Society, 2002. [doi]
@inproceedings{HashempourKP02,
title = {A Test-Vector Generation Methodology for Crosstalk Noise Faults},
author = {Hamidreza Hashempour and Yong-Bin Kim and Nohpill Park},
year = {2002},
url = {http://www.computer.org/proceedings/dft/1831/18310040abs.htm},
tags = {testing},
researchr = {https://researchr.org/publication/HashempourKP02},
cites = {0},
citedby = {0},
pages = {40-50},
booktitle = {17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1831-1},
}