Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi. Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 186-194, IEEE Computer Society, 2002. [doi]
@inproceedings{HashempourML02,
title = {Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE},
author = {Hamidreza Hashempour and Fred J. Meyer and Fabrizio Lombardi},
year = {2002},
url = {http://www.computer.org/proceedings/dft/1831/18310186abs.htm},
tags = {meta-model, testing, Meta-Environment, meta-objects},
researchr = {https://researchr.org/publication/HashempourML02},
cites = {0},
citedby = {0},
pages = {186-194},
booktitle = {17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings},
publisher = {IEEE Computer Society},
isbn = {0-7695-1831-1},
}