Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE - researchr publication related

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Hamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi. Test Time Reduction in a Manufacturing Environment by Combining BIST and ATE. In 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 6-8 November 2002, Vancouver, BC, Canada, Proceedings. pages 186-194, IEEE Computer Society, 2002. [doi]

The following publications are possibly variants of this publication:

Analysis and measurement of fault coverage in a combined ATE and BIST environmentHamidreza Hashempour, Fred J. Meyer, Fabrizio Lombardi. tim, 53(2):300-307, 2004. [doi]

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