Hamidreza Hashempour, Luca Schiano, Fabrizio Lombardi. Error-Resilient Test Data Compression Using Tunstall Codes. In 19th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2004), 10-13 October 2004, Cannes, France, Proceedings. pages 316-323, IEEE Computer Society, 2004. [doi]
Abstract is missing.