Masaki Hashizume, Yutaka Hata, Tomomi Nishida, Hiroyuki Yotsuyanagi, Yukiya Miura. Current Testable Design of Resistor String DACs. In 16th Asian Test Symposium, ATS 2007, Beijing, China, October 8-11, 2007. pages 399-403, IEEE, 2007. [doi]
Abstract is missing.