Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates - researchr publication authors

researchr

You are not signed in
Sign in
Sign up

Masaki Hashizume, Toshimasa Kuchii, Takeomi Tamesada. Supply Current Test for Unit-to-unit Variations of Electrical Characteristics in Gates. In 6th Asian Test Symposium (ATS 97), 17-18 November 1997, Akita, Japan. pages 372-377, IEEE Computer Society, 1997. [doi]

This author has not been identified. Look up 'Masaki Hashizume' in GoogleThis author has not been identified. Look up 'Toshimasa Kuchii' in GoogleThis author has not been identified. Look up 'Takeomi Tamesada' in Google

runs on WebDSL